CGTN published an article on Chinese President Xi Jinping’s inspection tour of central China’s Henan Province. Focusing on the province’s efforts to boost high-quality development and enhance governance efficiency, the article highlights the Chinese president’s emphasizing that high-quality development is fundamental to advancing Chinese modernization. BEIJING, May 21, 2025 (GLOBE

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR